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The webinar covers all basic & advanced concepts in VLSI Testing and DFT
- Introduction to VLSI Testing
- Logic Simulation
- Fault Modeling
- Fault Collapse
- Fault Simulation
- Testability
- Combinational ATPG
- Sequential ATPG
- Delay Test
- Physical Failure Analysis
- Design For Testability (DFT) Introduction
- DFT Internal Scan Chains
- DFT External Scan (JTAG)
- Logic Built-In Self Test (BIST)
- BIST Architecture
- Test Compression
- Memory Testing
- Boolean Testing without Fault Model
- Memory Diagnosis and Built-In-Self-Repair
- Boundary Scan and Core-Based Testing
- Analog and Mixed-Signal Testing
- Upcoming Trends in Testing
